Electrical analysis of DRAM cell transistors for the root-cause addressing of the tRDL time-delay failure
| Autor: | Joo Tae Moon, Sang U. Kim, U-In Chung, Young-pil Kim |
|---|---|
| Rok vydání: | 2003 |
| Předmět: |
Materials science
business.industry Transistor Electrical engineering Root cause Condensed Matter Physics Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials law.invention law Electronic engineering Electrical analysis Electrical and Electronic Engineering Safety Risk Reliability and Quality business Dram |
| Zdroj: | Microelectronics Reliability. 43:1461-1464 |
| ISSN: | 0026-2714 |
| DOI: | 10.1016/s0026-2714(03)00259-2 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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