Neutron, 64 MeV Proton, Thermal Neutron and Alpha Single-Event Upset Characterization of Xilinx 20nm UltraScale Kintex FPGA
Autor: | Jeff Barton, Pierre Maillard, James Karp, Michael J. Hart, Praful Jain |
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Rok vydání: | 2015 |
Předmět: | |
Zdroj: | 2015 IEEE Radiation Effects Data Workshop (REDW). |
Popis: | The single-event response of Xilinx 20nm UltraScale Kintex FPGA is characterized using neutron, 64 MeV proton, thermal neutron and alpha foil irradiation sources. Single-event upset and multi-bits upset results are presented. |
Databáze: | OpenAIRE |
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