Frequency-dependent, rectification current in metal-semiconductor-metal detectors
| Autor: | B. Stann, W. Ruff, Michael R. Stead, Keith Aliberti, Hongen Shen |
|---|---|
| Rok vydání: | 2002 |
| Předmět: |
Materials science
Physics::Instrumentation and Detectors Displacement current business.industry Detector Photodetector Biasing Condensed Matter::Mesoscopic Systems and Quantum Hall Effect Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Optics Rectification Optoelectronics High Energy Physics::Experiment Transient response Transient (oscillation) Electrical and Electronic Engineering business Voltage |
| Zdroj: | IEEE Photonics Technology Letters. 14:381-383 |
| ISSN: | 1941-0174 1041-1135 |
| DOI: | 10.1109/68.986820 |
| Popis: | Recent experiments show that variation in rectification current with ac-bias frequency exists in metal-semiconductor-metal (MSM) detectors. In this letter, we theoretically study the frequency-dependent rectification current in MSM detectors. Under transient bias voltage the MSM detector shows two of the following transient current responses: 1) a fast one related to the displacement current and 2) a slow one related to the removal of carriers from the detector. Rectification current exists in asymmetric MSM detectors and varies not only with ac voltage and optical power, but also with ac-bias frequency. The theoretical results agree with observed experimental results. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|