Structural characterization of CdSe/ZnS core–shell quantum dots (QDs) using TEM/STEM observation
Autor: | Youngil Jang, Hui-Youn Shin, M. J. Cho, Dongseon Jang, Kyuho Park, Jaesung Hwang |
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Rok vydání: | 2014 |
Předmět: |
Diffraction
Photoluminescence Materials science Condensed Matter::Other business.industry Physics::Optics Nanotechnology Condensed Matter::Mesoscopic Systems and Quantum Hall Effect Condensed Matter Physics Dark field microscopy Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Condensed Matter::Materials Science Semiconductor Transmission electron microscopy Quantum dot Quantum efficiency Electrical and Electronic Engineering High-resolution transmission electron microscopy business |
Zdroj: | Journal of Materials Science: Materials in Electronics. 25:2047-2052 |
ISSN: | 1573-482X 0957-4522 |
DOI: | 10.1007/s10854-014-1838-x |
Popis: | CdSe/ZnS core–shell structured nano-crystal quantum dots (QDs) are ideal candidates for light-emission applications due to their high quantum efficiency, narrow-band, and particle-size-tunable photoluminescence. In particular, their small size results in the quantum confinement of semiconductor nano-crystals, which widens their energy gaps. In general, structural analyses of QDs using a transmission electron microscope (TEM) are very important due to the significantly small size of QDs. We were able to obtain structural information of CdSe/ZnS core–shell QDs using nano-beam diffraction by controlling the nano-probe of the dark field scanning TEM (DF-STEM) mode and strain analysis with high-resolution TEM (HRTEM)/STEM images. Furthermore, we could clearly distinguish the interface between the CdSe core and the ZnS shell from the strain analysis with the HRTEM/STEM images. |
Databáze: | OpenAIRE |
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