The Exxon microtomography beam line at the National Synchrotron Light Source (invited)

Autor: K. L. D’Amico, H. W. Deckman, S. R. Ferguson, J. H. Dunsmuir, B. P. Flannery
Rok vydání: 1992
Předmět:
Zdroj: Review of Scientific Instruments. 63:574-577
ISSN: 1089-7623
0034-6748
Popis: Instrumentation for beam line X2 at the National Synchrotron Light Source is described. The beam line is configured as a dedicated experimental station whose design has been optimized for carrying out both microtomography and microradiography. The facility has proven to be a reliable three‐dimensional microscope for imaging the interior structure of heterogeneous materials.
Databáze: OpenAIRE