| Autor: |
Helmut Graeb, Kurt Antreich, Michael Pronath |
| Rok vydání: |
2003 |
| Předmět: |
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| Zdroj: |
Modeling, Simulation, and Optimization of Integrated Circuits ISBN: 9783034894265 |
| DOI: |
10.1007/978-3-0348-8065-7_18 |
| Popis: |
An overview of the problem of go/no-go testing for parametric faults in analog integrated circuits is given. In a linear model that includes both test stimulus and measurement errors, the influence of such errors on the test decision is analyzed in order to calculate trade-off curves for the probabilities of misclassification. This is achieved by an optimization of the correlation between test and performance. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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