Superconducting Properties of Amorphous Multilayer Metal-Semiconductor Composites

Autor:	R. W. Burkhardt, Stanford R. Ovshinsky, J. T. Chen, John E. Keem, Alan M. Kadin
Rok vydání:	1984
Předmět:	Superconductivity Materials science Economies of agglomeration Lattice (order) Parallel field Epitaxy Engineering physics Critical field Metal semiconductor Amorphous solid
Zdroj:	MRS Proceedings. 37
ISSN:	1946-4274 0272-9172
DOI:	10.1557/proc-37-503
Popis:	Following the earlier multilayer work of Ovshinsky and colleagues, we have fabricated thin-film samples consisting of alternating periodic layers of a transition metal (Nb, Mo, W) and a semiconducting element (Si, Ge, C) by sequential sputtering from two targets onto room-temperature substrates. The regular repeat spacing has been varied from 10 Å to more than 100 Å, with as many as several hundred layer pairs. Crystalline epitaxy was not required or even desired; many samples were largely amorphous as determined from x-ray scattering. Electrical transport measurements of superconducting properties have been carried out parallel to the layers. Samples exhibited highly anisotropic superconducting critical magnetic fields, with some values in excess of 200kG parallel to the layers. Evidence suggesting an asymmetric interface profile will be presented.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::5e30497ea18eae4d5a171bd1120b9cae https://doi.org/10.1557/proc-37-503 Zobrazit plný text záznamu Full text from SpringerLink