A Special Section on Instrumental Development and Application of Atomic Force Microscopy

Autor:	Yang Gan, Guangyi Shang, Jian Zhong, Yinlin Sha
Rok vydání:	2017
Předmět:	Materials science Atomic force microscopy Special section General Materials Science Development (differential geometry) Engineering physics
Zdroj:	Science of Advanced Materials. 9:52-54
ISSN:	1947-2935
DOI:	10.1166/sam.2017.3017
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::5e110999ef1be3352d7f423bdf898486 https://doi.org/10.1166/sam.2017.3017 Zobrazit plný text záznamu