Nanoanalysis of interfacial chemistry

Autor: Henning Galinski, C. B. Ene, Patrick Stender, Ralf Schlesiger, Guido Schmitz
Rok vydání: 2010
Předmět:
Zdroj: JOM. 62:58-63
ISSN: 1543-1851
1047-4838
DOI: 10.1007/s11837-010-0182-8
Popis: In recent years, atom probe tomography has advanced to an outstanding tool of analyzing interfacial chemistry in nanostructured materials. In this article, quantitative measurements of the natural width of multilayer interfaces and of segregation at grain boundaries and even at separate triple junctions of the boundary structure are presented and their physical consequences discussed.
Databáze: OpenAIRE
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