Polarization tomography of residual stresses in trigonal single crystals

Autor:	A. E. Puro, D. D. Karov
Rok vydání:	2015
Předmět:	Optic axis of a crystal Materials science Uniaxial crystal Condensed matter physics business.industry Physics::Optics Polarization (waves) Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Crystal Optical axis Optics Residual stress Tomography business Single crystal
Zdroj:	Optics and Spectroscopy. 119:887-892
ISSN:	1562-6911 0030-400X
DOI:	10.1134/s0030400x15110181
Popis:	A way to determine residual stresses in cylindrical trigonal single crystals the optical axis of which is directed along the crystal axis is proposed. It is assumed that the residual deformation tensor is of thermal character and is characterized by fictive temperature. The measurements are performed in the middle part of a single crystal the length of which is much larger than its diameter; therefore, the stresses in this part do not vary along the single crystal axis. The reconstruction of stresses is based on determining characteristic parameters of polarized light by use of the tomographic method in the plane orthogonal to the single crystal axis.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::5dca762aae82879ea94e7791a607de13 https://doi.org/10.1134/s0030400x15110181 Zobrazit plný text záznamu Plný text ve formátu PDF