Autor: |
Hue Thi-Bach Nguyen, J. Earl Rudisill |
Rok vydání: |
1992 |
Předmět: |
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Zdroj: |
SPIE Proceedings. |
ISSN: |
0277-786X |
Popis: |
Gain enhancement from IR detectors could be realized if they were antireflection (AR) coated. The feasibility of AR coating silicon surfaces over the 6 to 11 micron and 11 to 17 micron bands has been demonstrated using single and double-layer coatings. The band averaged reflectance values were reduced from about 30% to about 4% with double-layer coatings. The actual spectral reflectance curves agreed very closely to the computer-modelled performances. Temperature and material-pair parameters were established that resulted in thermally durable combinations. The coated silicon was successfully cycled between room temperature and 77 degrees Kelvin. Application of this coating to Si:As Impurity Band Conduction detectors was successfully demonstrated in the 6 to 11 micron spectral band. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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