Lifetime and Material Characteristics of Multicrystalline Silicon Measured with High Spatial Resolution
| Autor: | Christopher Hebling, W. Warta, Stephan W. Glunz |
|---|---|
| Rok vydání: | 1996 |
| Předmět: |
Materials science
Silicon business.industry Analytical chemistry chemistry.chemical_element Thermal treatment Carrier lifetime Condensed Matter Physics Atomic and Molecular Physics and Optics Fourier transform spectroscopy law.invention chemistry law Solar cell High spatial resolution Optoelectronics General Materials Science Dislocation business |
| Zdroj: | Solid State Phenomena. :69-74 |
| ISSN: | 1662-9779 |
| DOI: | 10.4028/www.scientific.net/ssp.51-52.69 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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