Challenges in Phase Plate Product Development
Autor: | Bart Buijsse, Kasim Sader, Gijs van Duinen, Radostin Danev |
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Rok vydání: | 2014 |
Předmět: | |
Zdroj: | Microscopy and Microanalysis. 20:218-219 |
ISSN: | 1435-8115 1431-9276 |
Popis: | The use of a phase plate in electron microscopy has shown renewed interest, triggered by a publication on this topic in 2001 by Danev and Nagayama [1]. This interest can be understood from the fact that many samples that are studied in TEM are weak phase objects. The use of a phase plate is the obvious method of choice to convert otherwise invisible phase modulations into visible amplitude modulations in the detected intensity profile. A phase plate can provide in-focus phase contrast, unlike the conventional method where a strong defocus is needed to generate contrast at low spatial resolutions, with the added consequence of introducing contrast reversals as a function of frequency. |
Databáze: | OpenAIRE |
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