Challenges in Phase Plate Product Development

Autor: Bart Buijsse, Kasim Sader, Gijs van Duinen, Radostin Danev
Rok vydání: 2014
Předmět:
Zdroj: Microscopy and Microanalysis. 20:218-219
ISSN: 1435-8115
1431-9276
Popis: The use of a phase plate in electron microscopy has shown renewed interest, triggered by a publication on this topic in 2001 by Danev and Nagayama [1]. This interest can be understood from the fact that many samples that are studied in TEM are weak phase objects. The use of a phase plate is the obvious method of choice to convert otherwise invisible phase modulations into visible amplitude modulations in the detected intensity profile. A phase plate can provide in-focus phase contrast, unlike the conventional method where a strong defocus is needed to generate contrast at low spatial resolutions, with the added consequence of introducing contrast reversals as a function of frequency.
Databáze: OpenAIRE