| Autor: |
C. F. Majkrzak, R. F. C. Farrow, T. R. Gentile, Julie A. Borchers, C S. Bailey, N. Remmes, W. C. Chen, Alan K. Thompson, W. M. Snow, Daniel S. Hussey, K. V. O’Donovan |
| Rok vydání: |
2003 |
| Předmět: |
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| Zdroj: |
Physica B: Condensed Matter. 335:196-200 |
| ISSN: |
0921-4526 |
| DOI: |
10.1016/s0921-4526(03)00236-9 |
| Popis: |
At the National Institute of Standards and Technology (NIST) and Indiana University, we are developing polarized 3 He analyzers for neutron reflectometry. We have employed 3 He analyzers at two polarized neutron reflectometers, NG1 at the NIST Center for Neutron Research (NCNR) and POSY I at the Intense Pulsed Neutron Source (IPNS), Argonne National Laboratory. The long-term goal for both efforts is to perform efficient studies of magnetic diffuse scattering. At the NCNR, we tested a 3 He analyzer by comparing measurements of specular scattering obtained with a supermirror analyzer to those obtained with a 3 He analyzer. For this test, we measured the spin-flip and nonspin-flip scattering from a Mn0.52Pd0.48/Fe thin film. The results with the 3 He analyzer show very good agreement with those obtained with the supermirror analyzer. We have also carried out tests of the 3 He analyzer for application to magnetic diffuse scattering experiments. We discuss the development of a 3 He analyzer for IPNS that will be employed for studies of patterned magnetic arrays. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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