| Autor: |
Li Jing Li, Hui Li, Rui Pan, Wen Hui Zhang, Xiu Juan Feng |
| Rok vydání: |
2013 |
| Předmět: |
|
| Zdroj: |
Advanced Materials Research. :277-280 |
| ISSN: |
1662-8985 |
| DOI: |
10.4028/www.scientific.net/amr.760-762.277 |
| Popis: |
The temperature stability of scale factor (SF) has been analyzed and tested systematically for an optical voltage sensor (OVS) based on Pockels effect in this paper. The cardinal temperature sensitive parameters in sensor head and their impacts on SF are brought out by theoretical analysis and simulation method. Corresponding experiments are arranged to verify the validity of theoretical analysis. A real-time temperature compensation system is fabricated to reduce the error of SF in temperature fluctuation environment and its effectiveness is certified by experiment. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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