An eye for impurity

Autor: Paul S. Peercy
Rok vydání: 2002
Předmět:
Zdroj: Nature. 416:799-801
ISSN: 1476-4687
0028-0836
DOI: 10.1038/416799a
Popis: As electronic devices become smaller, so the challenge of maintaining their electrical properties grows. Identifying the positions of introduced impurities in a semiconductor crystal is a major first step.
Databáze: OpenAIRE