An eye for impurity
Autor: | Paul S. Peercy |
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Rok vydání: | 2002 |
Předmět: | |
Zdroj: | Nature. 416:799-801 |
ISSN: | 1476-4687 0028-0836 |
DOI: | 10.1038/416799a |
Popis: | As electronic devices become smaller, so the challenge of maintaining their electrical properties grows. Identifying the positions of introduced impurities in a semiconductor crystal is a major first step. |
Databáze: | OpenAIRE |
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