Grazing Incidence X-Ray Diffraction Study of A Glass-Liquid Crystal Buried Interface

Autor:	L. J. Martínez Miranda
Rok vydání:	1996
Předmět:	Micrometre Diffraction National Synchrotron Light Source Optics Materials science Beamline business.industry Liquid crystal X-ray crystallography Grating business Penetration depth
Zdroj:	MRS Proceedings. 437
ISSN:	1946-4274 0272-9172
Popis:	We have used Grazing Incidence X-ray Diffraction to study the structure of a liquid crystal (LC) at the buried LC-glass interface in micrometer size LC films. This measurement is done in reflection mode through the glass substrate, which consists of a grating photolithographed onto a 0.2mm slide. This experiment was performed in beamline X22B of the National Synchrotron Light Source at Brookhaven National Laboratory, using 1.3776Å X-ray radiation. We have used both the glass and LC absorption properties to control the penetration depth of the beam into the LC film bulk. The ability to measure LC interfaces in this manner is essential to study any LC device, arid its response to applied fields.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::5c6aa7f4bb1f82060e245abae715d49d https://doi.org/10.1557/proc-437-33 Zobrazit plný text záznamu Full text from SpringerLink