Autor: |
Fan Lei Wu, Dong-Sing Wuu, Snin Nan Lin, Hsin Her Yu, Ray-Hua Horng, Ming Chun Tseng |
Rok vydání: |
2012 |
Předmět: |
|
Zdroj: |
Vacuum. 86:843-847 |
ISSN: |
0042-207X |
DOI: |
10.1016/j.vacuum.2011.02.014 |
Popis: |
This article reports the quality of In x Ga 1− x As (0 x x Ga 1− x As epilayers is determined by x-ray reciprocal space mapping (RSM). From the RSM results, the crystalline quality of In x Ga 1− x As epilayers grown with small indium composition ( x x > 0.11) due to the small strain relaxation. The crystalline quality of In x Ga 1− x As epilayer is found to strongly depend on indium content. The photovoltaic performance of p–n structure In 0.16 Ga 0.84 As solar cell shows the lower device performance, because the In x Ga 1− x As films grown on 15°-off GaAs substrate show a large strain relaxation in the active layer of solar cell. It results in dislocation defects created at the initial active layer/In x Ga 1− x As graded layer interface. The performance of In 0.16 Ga 0.84 As solar cell with p–n structure can be significantly improved by the p–i–n structure. |
Databáze: |
OpenAIRE |
Externí odkaz: |
|