Characterisation of the DARE180U MOSFET Channel Geometry TID Radiation Sensitivity

Autor:	R.J.E. Jansen, B. Glass, C. Boatella-Polo, G. Thys, S. Verhaegen, G. Franciscatto, J. Wouters, D. Lambrichts, S. Vargas-Sierra, J. J. Gonzalez Lujan
Rok vydání:	2019
Zdroj:	2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
DOI:	10.1109/radecs47380.2019.9745671
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::5bdbe1af702ab49dd64fa6d9ea42f3e4 https://doi.org/10.1109/radecs47380.2019.9745671 Zobrazit plný text záznamu