Small angle scattering of 350 keV protons in silicon at grazing incidence

Autor:	Alfred Neufert, G. Clausnitzer, Ulrich Schiebel, Klaus Miethe
Rok vydání:	1979
Předmět:	Materials science Silicon business.industry Scattering chemistry.chemical_element General Medicine Small-angle neutron scattering Spectral line Monocrystalline silicon Optics chemistry Grazing-incidence small-angle scattering Small-angle scattering Atomic physics business Incidence (geometry)
Zdroj:	Nuclear Instruments and Methods. 164:183-187
ISSN:	0029-554X
DOI:	10.1016/0029-554x(79)90449-x
Popis:	Backscattering spectra of 350 keV protons incident on a randomly oriented silicon crystal have been measured for angles of incidence ranging from 0.25° to 4.0° and for scattering angles up to 7.5°. A simulation calculation based on multiple scattering inside the target has been performed. Good agreement with the experimental data is found.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::5bbc0f790175c37e5defa3295993dd66 https://doi.org/10.1016/0029-554x(79)90449-x Zobrazit plný text záznamu