The investigation of catastrophic failures in the CCD under the influence of the Heavy-Charged Particles
| Autor: | Artem N. Tsirkov, V.P. Lukashin, Alexander A. Novikov, Alexander A. Pechenkin, A.R. Gritsaenko |
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| Rok vydání: | 2020 |
| Předmět: | |
| Zdroj: | Problems of advanced micro- and nanoelectronic systems development. :231-235 |
| ISSN: | 2078-7707 |
| DOI: | 10.31114/2078-7707-2020-4-231-235 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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