Focused ion beam modification of atomic force microscopy tips for near-field scanning optical microscopy
| Autor: | Jeffrey R. Krogmeier, Robert C. Dunn |
|---|---|
| Rok vydání: | 2001 |
| Předmět: |
Optics
Materials science Physics and Astronomy (miscellaneous) business.industry Microscopy Scanning confocal electron microscopy Scanning ion-conductance microscopy Atomic force acoustic microscopy Near-field scanning optical microscope Conductive atomic force microscopy Scanning capacitance microscopy business Focused ion beam |
| Zdroj: | Applied Physics Letters. 79:4494-4496 |
| ISSN: | 1077-3118 0003-6951 |
| DOI: | 10.1063/1.1430028 |
| Popis: | A probe for near-field scanning optical microscopy is demonstrated based on a high index glass sphere attached to the end of a conventional atomic force microscopy tip. The sphere is machined into a pyramid geometry using a focused ion beam (FIB) instrument, coated with aluminum to confine the excitation light, and milled further with the FIB to open an aperture at the end of the tip. Near-field fluorescence images of 50 nm fluorescent latex spheres reveal subdiffraction limit spatial resolution, illustrating the utility of these probes for near-field scanning optical microscopy. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|