Time-of-flight measurement-based three-dimensional profiler system employing a lightweight Fresnel-type Risley prism scanner

Autor: Jae Heun Woo, Chu-Shik Kang, Jong-Ahn Kim, Jae Wan Kim, Sunghoon Eom, Jae Yong Lee
Rok vydání: 2022
Předmět:
Zdroj: Optical Engineering. 61
ISSN: 0091-3286
DOI: 10.1117/1.oe.61.5.054104
Databáze: OpenAIRE