Time-of-flight measurement-based three-dimensional profiler system employing a lightweight Fresnel-type Risley prism scanner
Autor: | Jae Heun Woo, Chu-Shik Kang, Jong-Ahn Kim, Jae Wan Kim, Sunghoon Eom, Jae Yong Lee |
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Rok vydání: | 2022 |
Předmět: | |
Zdroj: | Optical Engineering. 61 |
ISSN: | 0091-3286 |
DOI: | 10.1117/1.oe.61.5.054104 |
Databáze: | OpenAIRE |
Externí odkaz: |