Analysis of TID testing of a statistically large quantity of parts

Autor:	Jorn Voegtli, Richard E. Sharp, Lucy Oswald, Natalia Hong, Benjamin Archer
Rok vydání:	2021
Zdroj:	2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
DOI:	10.1109/radecs53308.2021.9954478
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::5b57511bdf069d9a86e71b85fcdae7ed https://doi.org/10.1109/radecs53308.2021.9954478 Zobrazit plný text záznamu