XPS and AES studies of the interface reaction at the practical Pt/InP interface
| Autor: | Hou-shun Tang, Guo-bao Jiang, Ivan Davoli, S. Stizza, Dao-xuan Dai |
|---|---|
| Rok vydání: | 1992 |
| Předmět: |
Interface (Java)
Phosphide Analytical chemistry General Physics and Astronomy chemistry.chemical_element Surfaces and Interfaces General Chemistry Spin–orbit interaction Condensed Matter Physics Intensity ratio Chemical reaction Surfaces Coatings and Films chemistry.chemical_compound chemistry X-ray photoelectron spectroscopy Platinum Spectroscopy |
| Zdroj: | Applied Surface Science. 62:249-254 |
| ISSN: | 0169-4332 |
| Popis: | X-ray photoelectron spectroscopy (XPS) and Auger-electron spectroscopy (AES) measurements have been used to study the practical Pt/InP interface. Evidence for the formation of platinum phosphide by chemical reaction at this interface is obtained. A monotonic decrease of the intensity ratio for two Pt4f spin-orbit-split peaks wth decraseing phtoemission angle is measured. Some possible interpretations for this change are also presented. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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