A DE-embedding technique for reflection-based S-parameter measurements of HMICs and MMICs
| Autor: | Fadhel M. Ghannouchi, Rached Hajji, A. Brodeur, François Beauregard |
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| Rok vydání: | 1995 |
| Předmět: |
Computer science
Condensed Matter Physics Network analyzer (electrical) Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Transmission (telecommunications) Reflection (physics) Electronic engineering Calibration Scattering parameters Embedding Electrical and Electronic Engineering Reflection coefficient Microwave |
| Zdroj: | Microwave and Optical Technology Letters. 10:218-222 |
| ISSN: | 1098-2760 0895-2477 |
| DOI: | 10.1002/mop.4650100408 |
| Popis: | A generalized calibration and de-embedding technique for reflection-based S-parameter measurements of microwave devices is proposed. This technique allows two-port calibration of a network analyzer directly from the embedded reflection coefficient measurements. This technique is a general one, in the sense that it can be implemented in network analyzers with or without transmission measurement capabilities. © 1995 John Wiley & Sons, Inc. |
| Databáze: | OpenAIRE |
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