Impact of Aluminum Metallization Reconstruction on the Current Distribution in Power Semiconductors

Autor:	Marcel Sippel, Simon Hassel, Ralf Schmidt, Mario Sprenger, Christoph Hecht, Jorg Franke
Rok vydání:	2022
Zdroj:	2022 IEEE 9th Electronics System-Integration Technology Conference (ESTC).
DOI:	10.1109/estc55720.2022.9939542
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::5b1908bd302a7249907811ce8a58cd4e https://doi.org/10.1109/estc55720.2022.9939542 Zobrazit plný text záznamu