| Popis: |
This report presents the results of an aging experiment that was established in FY09 and completed in FY10 for the Sandia MEMS Passive Shock Sensor. A total of 37 packages were aged at different temperatures and times, and were then tested after aging to determine functionality. Aging temperatures were selected at 100 C and 150 C, with times ranging from as short as 100 hours to as long as 1 year to simulate a predicted aging of up to 20 years. In all of the tests and controls, 100% of the devices continued to function normally. |
