Autor: |
Denise A. Cleghorn, Sam V. Nablo, Douglas E. Weiss |
Rok vydání: |
2002 |
Předmět: |
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Zdroj: |
Radiation Physics and Chemistry. 63:581-586 |
ISSN: |
0969-806X |
DOI: |
10.1016/s0969-806x(01)00597-7 |
Popis: |
The application of low-energy electrons for the disinfection of containers of complex geometries has been limited due to their inability to efficiently penetrate the rigid walls. Most three-dimensional applications have been evaluated using higher energy processors with bulk or through-the-wall treatment. This work has been directed to the validation of electron disinfection of interior surfaces by injecting electrons through the open-mouth of the container. Both direct thin-film dosimetric mapping of the interior and exterior dose distributions for in-line treatment have been conducted and compared with the results of Monte Carlo modeling utilizing 106 or more source electron histories. Sterilizer characterization and model assumptions are described and the advantages of the modeling technique for process parameter optimization discussed. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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