| Autor: |
Walajabad S. Sampath, Amit Munshi, John Raguse, Kurt L. Barth, John M. Walls, Ali Abbas |
| Rok vydání: |
2014 |
| Předmět: |
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| Zdroj: |
2014 IEEE 40th Photovoltaic Specialist Conference (PVSC). |
| DOI: |
10.1109/pvsc.2014.6925235 |
| Popis: |
The performance of CdTe thin film photovoltaic devices are sensitive to process parameters. In this study, efforts are made to further understand the effects of process parameters like process temperature and variation in cadmium chloride passivation treatment on CdTe films deposited using a sublimation based deposition system. The effects on film microstructure are studied using advanced microstructural characterization methods like TEM, SEM, EDS and SIMS while electrical performance is studied using various electrical measurements such as current density vs. voltage and electroluminescence. The aim of this study is to provide new insight into the understanding of relationship between fabrication process, device performance and thin film microstructure. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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