Structural and Chemical Studies via TEM and EELS of the SiC - MOS Structures

Autor: Tsvetanka Zheleva, Aivars Lelis, Gerd Dusher, Fude Liu, Mrinal Das, James Scofield
Rok vydání: 2007
Zdroj: ECS Meeting Abstracts. :1266-1266
ISSN: 2151-2043
DOI: 10.1149/ma2007-02/24/1266
Popis: not Available.
Databáze: OpenAIRE