ToF-SIMS imaging of dopant diffusion in optical fibers

Autor:	A. Claesson, L-E Nilsson, M. Hellsing, Michael Fokine, Walter Margulis
Rok vydání:	2003
Předmět:	Optical fiber Materials science Dopant Doping Analytical chemistry General Physics and Astronomy chemistry.chemical_element Germanium Surfaces and Interfaces General Chemistry Condensed Matter Physics Surfaces Coatings and Films law.invention Erbium chemistry Fiber Bragg grating law Fluorine Fiber
Zdroj:	Applied Surface Science. :648-651
ISSN:	0169-4332
DOI:	10.1016/s0169-4332(02)00783-3
Popis:	Applications of optical fibers in telecommunication and sensing are rapidly emerging where the fiber properties are related to the controlled addition of dopants such as germanium, phosphorous, fluorine and erbium. The modern ToF-SIMS instrument, with its high sensitivity and high lateral resolution, has shown to be an excellent tool to directly analyze cross-sections of as-manufactured fibers. The present work describes ToF-SIMS imaging of the dopant distribution in fluorine, germanium and rare-earth doped fibers where dopants are confined to a few μm in the core. The increased fluorine diffusion in the fluorine doped fibers due to chemical reactions with hydroxyl groups was examined. This process is utilized in the manufacture of thermally stable chemical composition fiber Bragg gratings. We were able to produce ToF-SIMS elemental images with a lateral resolution around 0.5 μm showing the detailed distribution of the dopants.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::5a6b7870a009da50914c4a130cb91847 https://doi.org/10.1016/s0169-4332(02)00783-3 Zobrazit plný text záznamu Full Text from ScienceDirect