Accurate Characterization of Fringing Effects at On-Chip Line Steps

Autor:	Lohit Sagar Dutta, Thomas-Michael Winkel, Hartmut Grabinski
Rok vydání:	2000
Předmět:	Physics Length measurement Field (physics) Scattering Reflection (physics) Scattering parameters Electronic engineering Propagation constant Classification of discontinuities Line (electrical engineering)
Zdroj:	56th ARFTG Conference Digest.
DOI:	10.1109/arftg.2000.327445
Popis:	The electrical scattering field at steps on interconnects can be taken into account by a virtual additional line length of the wider line [1]. This effect must be taken into account when characterizing on and off-chip interconnects with discontinuities. The theory will be discussed and measurement results will be presented.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::5a60d4600f98e64b4e4ac2330cffb485 https://doi.org/10.1109/arftg.2000.327445 Zobrazit plný text záznamu