Analysis of evaluation index for the electron laminar properties in the electron optical system
| Autor: | Jian Zhang, Zhihui Geng, Qi Jin |
|---|---|
| Rok vydání: | 2022 |
| Předmět: | |
| Zdroj: | Journal of Physics: Conference Series. 2290:012030 |
| ISSN: | 1742-6596 1742-6588 |
| Popis: | In the simulation of the electron optical system of vacuum electronic devices, the evaluation of the electron laminar properties can only be judged by observing the electron trajectories. The quantitative evaluation index parameters for the electron laminar properties is lacking in the electron optical software. To achieve a quantitative analysis of the electron laminar properties in Egun simulations, the crossover rate evaluating the laminar properties of electron properties is presented in this paper. The simulation results show that the crossover rate index can accurately and quantitatively evaluate the quality of the electron laminar properties. When the crossover rate of electron properties is less than 3%, the designed electron optical system meets the engineering requirements. The crossover rate can be used as the target parameters in the automatic optimization of electron optical system. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|