Characterization and application of multilayer diffraction gratings as optochemical sensors
| Autor: | Sergii Mamykin, M. Klopfleisch, O. Yastrubchak, N. L. Dmitruk, O.I. Mayeva |
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| Rok vydání: | 2001 |
| Předmět: |
Materials science
business.industry Schottky barrier Surface plasmon Metals and Alloys Physics::Optics Schottky diode Condensed Matter Physics Surfaces Coatings and Films Electronic Optical and Magnetic Materials Characterization (materials science) Optics Ellipsometry Transmittance Optoelectronics Electrical and Electronic Engineering Surface plasmon resonance business Instrumentation Diffraction grating |
| Zdroj: | Sensors and Actuators A: Physical. 88:52-57 |
| ISSN: | 0924-4247 |
| Popis: | This paper is devoted to the surface characterization of phase diffraction gratings which are the key optical components of optochemical sensors. Surface plasmon resonance (SPR) in a Schottky junction with the diffraction grating at the interface is used as a basic principle underlying the device operation. With the aim of optimization of its technical parameters, the optical characterization of thin metal films is necessary. The adequate characterization tools were demonstrated: variable angle spectroscopic ellipsometry (VASE); atomic force microscopy (AFM); reflectance/transmittance spectroscopy; spectral and angular characteristics of Schottky junction photoresponse. Along with investigation technique, the most physically correct theoretical model (Bruggeman-EMA) for describing the optical and structural features of multilayer systems was employed. Potentialities of the optochemical sensor have been demonstrated as well. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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