| Popis: |
The inverse problem for plane wave excitation of a small soft ellipsoidal boss on a rigid base plane is considered. It is shown that one measurement of the leading order low-frequency coefficient of the real part of the specular scattering amplitude and four measurements of the second order coefficient are sufficient to specify the semiaxes of the boss and its orientation. The leading order terms of the scattering amplitude for the boss plus base plane are obtained from that of the ellipsoid by an image technique, and the first two terms of the real part are used to solve the inverse problem. |
