Latest advances in nanomaterial characterisation: from the micron scale to the atom scale

Autor:	F. Horreard, M. Schuhmacher, L. Renaud, F. Hillion
Rok vydání:	2006
Předmět:	Secondary Ion Mass Spectroscopy Materials science Scale (ratio) law Nanostructured materials Micron scale Nanotechnology Atom probe law.invention Nanomaterials
Zdroj:	2006 IEEE Nanotechnology Materials and Devices Conference.
DOI:	10.1109/nmdc.2006.4388733
Popis:	This paper concentrates on the recent developments or breakthroughs of two main analytical techniques used in the field : SIMS and atom probe.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::59a80d38542d313bf6b89262949638cc https://doi.org/10.1109/nmdc.2006.4388733 Zobrazit plný text záznamu