| Autor: |
Djamila Doumaz, Amel Chenouf, Abdelmadjid Benabdelmomene, Cherifa Tahanout, Abdelhak Feraht Hemida, Mohamed Boubaaya, Hakim Tahi, Boualem Djezzar |
| Rok vydání: |
2015 |
| Předmět: |
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| Zdroj: |
2015 IEEE International Integrated Reliability Workshop (IIRW). |
| DOI: |
10.1109/iirw.2015.7437083 |
| Popis: |
Instead, the classical consideration that the geometric component in charge pumping method (CP) is parasitic component, in this work we demonstrate that this component can be used to estimate the negative bias temperature (NBTI) induced mobility degradation using the charge pumping based method such as on- the-fly interface trap (OTFIT). |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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