Infrared Refractive Index Measurement of Niobium Nitride Thin-Film via FTIR

Autor:	Dip Joti Paul, Tony X. Zhou, Karl K. Berggren
Rok vydání:	2022
Zdroj:	Conference on Lasers and Electro-Optics.
Popis:	We report the optical constants of thin-film NbN in the wavelength of 2.5 to 25 µm, which is determined by fitting Drude-Lorentz dielectric function to the reflectance and transmittance data obtained via FTIR.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::594f8b8fb39bfb8259355f1e47e05608 https://doi.org/10.1364/cleo_at.2022.jw3a.32 Zobrazit plný text záznamu