Femtosecond time-resolved dielectric function measurements by dual-angle reflectometry

Autor:	J. P. Callan, Eric Mazur, E. N. Glezer, L. Huang, A. M.-T. Kim, C. A. D. Roeser, Y. Siegal
Rok vydání:	2003
Předmět:	Materials science business.industry Isotropy Physics::Optics Time resolution Photon energy Optics Error analysis Femtosecond Dielectric function Thin film business Reflectometry Instrumentation
Zdroj:	Review of Scientific Instruments. 74:3413-3422
ISSN:	1089-7623 0034-6748
DOI:	10.1063/1.1582383
Popis:	We present a technique to measure the dielectric function of a material with femtosecond time resolution over a broad photon energy range. The absolute reflectivity is measured at two angles of incidence, and e(ω) is calculated by numerical inversion of Fresnel-like formulas. Using white-light generation, the single-color probe is broadened from the near IR to the near UV, but femtosecond time resolution is maintained. Calibration of the apparatus and error analysis are discussed. Finally, measurements of isotropic, thin film, and uniaxial materials are presented and compared to reflectivity-only studies to illustrate the merit of the technique.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::5932dfd0c61f4f19ae8f19042b7e082c https://doi.org/10.1063/1.1582383 Zobrazit plný text záznamu