Analysis of the composition of graphene-oxide films using a backscattered H+ ion beam
| Autor: | E. V. Egorov, A. D. Mokrushin, V. A. Smirnov |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Materials science
Ion beam Orders of magnitude (temperature) Graphene Analytical chemistry Oxide 02 engineering and technology Conductivity 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences Surfaces Coatings and Films Ion law.invention chemistry.chemical_compound chemistry law Composition (visual arts) Thin film 0210 nano-technology |
| Zdroj: | Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 10:637-640 |
| ISSN: | 1819-7094 1027-4510 |
| DOI: | 10.1134/s1027451016030290 |
| Popis: | The O/C atomic ratios in films of oxidized and partially reduced graphene oxide are determined via the Rutherford backscattering of H+ ions. In addition, the conductivity σ is measured. It is established that the reduction noticeably decreases the О/С ratio and increases σ by a few orders of magnitude. We demonstrate for the first time the efficiency of Rutherford backscattering in studying graphene-type objects. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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