Total Ionizing Dose Characterization of an 8-bit 200-MSps Switched-Capacitor Pipeline A-to-D Converter in 32nm SOI CMOS
| Autor: | Anthony Amort, Alfio Zanchi, Manuel Cabanas-Holmen, Barry Meaker, Mark Yao |
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| Rok vydání: | 2016 |
| Předmět: |
Engineering
Spurious-free dynamic range business.industry Pipeline (computing) 020208 electrical & electronic engineering 8-bit Electrical engineering 020206 networking & telecommunications 02 engineering and technology Switched capacitor Least mean squares filter Sine wave Signal-to-noise ratio (imaging) Absorbed dose 0202 electrical engineering electronic engineering information engineering Electronic engineering business |
| Zdroj: | 2016 IEEE Radiation Effects Data Workshop (REDW). |
| Popis: | A Radiation-Hardened By Design 8-bit 32nm SOI CMOS pipeline ADC shows no AC performance nor non-linearity worsening vs. TID when operated at 200MSps sampling rate, -1dBFS sinewave input amplitude. The circuit shows no visible performance variation during irradiation, and maintains >42dBFS SNR, >61dBc SFDR up to 1Mrad(Si) after LMS (Least Mean Square) gain and offset calibration techniques are applied. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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