Chromatic dispersion characterization for meter-long CMOS compatible spiral waveguides
| Autor: | Yuhua Li, Shao Hao Wang, Brent E. Little, Linghua Wang, Sai T. Chu, Lanqian Zeng |
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| Rok vydání: | 2020 |
| Předmět: |
Materials science
business.industry 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Characterization (materials science) law.invention 010309 optics Interferometry Optics law 0103 physical sciences Dispersion (optics) Range (statistics) Metre 0210 nano-technology business Waveguide Spiral Cmos compatible |
| Zdroj: | 14th Pacific Rim Conference on Lasers and Electro-Optics (CLEO PR 2020). |
| Popis: | We demonstrated that the chromatic dispersion of CMOS-compatible waveguide sets increases with their thickness from -465 to 45 ps/nm/km by extending the measuring range of interferometer-based scheme beyond the maximum length of optical delay line. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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