Improving the Performance of Mutation-based Fault Localization via Mutant Bias Practical Experience Report
| Autor: | Bin Du, Yuxiaoyang Cai, Haifeng Wang, Yong Liu, Xiang Chen |
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| Rok vydání: | 2022 |
| Zdroj: | 2022 IEEE 33rd International Symposium on Software Reliability Engineering (ISSRE). |
| DOI: | 10.1109/issre55969.2022.00038 |
| Databáze: | OpenAIRE |
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