Accelerated aging test of Solid-State DC Circuit Breaker based on 2.5 kV Reverse Blocking IGCT
| Autor: | Pietro Cairoli, Utkarsh Raheja, Luca Raciti, Antonello Antoniazzi, Rostan Rodrigues |
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| Rok vydání: | 2020 |
| Předmět: |
Materials science
Blocking (radio) 05 social sciences Varistor 020207 software engineering 02 engineering and technology Fault (power engineering) Accelerated aging Automotive engineering Power (physics) Integrated gate-commutated thyristor Reliability (semiconductor) 0202 electrical engineering electronic engineering information engineering 0501 psychology and cognitive sciences 050107 human factors Circuit breaker |
| Zdroj: | 2020 IEEE Energy Conversion Congress and Exposition (ECCE). |
| DOI: | 10.1109/ecce44975.2020.9235953 |
| Popis: | This paper presents the accelerated ageing test results of solid-state circuit breaker based on the 2.5 kV Reverse Blocking IGCT (RB-IGCT). Solid-State Circuit Breakers (SSCB) are protection and safety devices and must have high reliability, especially when a system fault or overload happens. Because circuit breakers operate very differently from the typical power converter and undergo different sets of stresses (continuous on-state gate bias, surge currents and short-circuit withstanding, etc.), a specific reliability and accelerated aging study is necessary. This paper presents the results of accelerated ageing tests, by performing 10,000 short-circuit current interruptions at 1 kV, 4.7 kA, on an RB-IGCT based breaker module and presents the ageing characteristics of the RB-IGCT and the parallel metal oxide varistor (MOV) over the course of testing. The experimental results show about 5-6% increase in on-state forward voltage of the RB-IGCT and a similar percentage increase in the MOV clamping voltage. |
| Databáze: | OpenAIRE |
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