Assessing SiCr resistor drift for automotive analog ICs
| Autor: | D. Price, J.P. Gambino, Matt Ring, K. Kimura, R.C. Jerome, Kevin A. Stewart, A. Hasegawa, P. Hulse, K. Noldus |
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| Rok vydání: | 2021 |
| Předmět: |
010302 applied physics
Materials science Physics::Instrumentation and Detectors business.industry Automotive industry Integrated circuit Operating life 01 natural sciences Temperature measurement Automotive engineering Computer Science::Other law.invention Stress (mechanics) Computer Science::Emerging Technologies Reliability (semiconductor) law 0103 physical sciences Resistor business Current density |
| Zdroj: | IRPS |
| Popis: | A very stable resistor is needed for analog integrated circuits employed in harsh automotive environments. Precision SiCr thin-film resistors have been characterized by DC and pulsed I-V measurements, high-temperature operating life, and high temperature storage stress. Maximum current density for a maximum drift of 0.1% over the product lifetime are determined. Furthermore, SiCr resistors are stressed to failure and the physical failure mechanism is analyzed. |
| Databáze: | OpenAIRE |
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