First Experimental Demonstration of MRAM Data Scrubbing: 80 Mb MRAM with 40 nm junctions for Last Level Cache Applications

Autor:	H. Wu, V. Katragadda, E. Evarts, E. Edwards, R. Southwick, A. Dutta, G. Lauer, V. Mehta, R. Johnson, O. van der Straten, A. Reznicek, M. Wordeman, M. Rizzolo, R. Patlolla, D. Metzler, C. Yang, D. Edelstein, D. Canaperi, S. Teehan, J.M. Slaughter, D.C. Worledge
Rok vydání:	2021
Zdroj:	2021 IEEE International Electron Devices Meeting (IEDM).
DOI:	10.1109/iedm19574.2021.9720539
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::5859f04041fcace30727c2e609d802a5 https://doi.org/10.1109/iedm19574.2021.9720539 Zobrazit plný text záznamu