On-line CMOS BICS: an experimental study

Autor: Y. Maidon, Y. Deval, J. Temas, F. Verdier, J.B. Begueret, J.P. Dom
Rok vydání: 2002
Předmět:
Zdroj: Digest of Papers IEEE International Workshop on IDDQ Testing.
DOI: 10.1109/iddq.1997.633019
Popis: A CMOS built-in current sensor is proposed. It is dedicated to mixed signal circuits power supply current monitoring. It takes advantage of a parasitic resistor, so its implementation is very transparent. Measurement results of a manufactured test chip highlight the behaviors of the sensor in terms of linearity, speed and noise.
Databáze: OpenAIRE