Automated comparison of measured versus expected signals in mixed signal device testing and its effect on fault localization strategies

Autor:	M. Chowanetz, W. Wolz, K. Helmreich, Klaus D. Müller-Glaser, R. Scharf
Rok vydání:	2002
Předmět:	Production testing Engineering business.industry media_common.quotation_subject Process (computing) Mixed-signal integrated circuit Fault (power engineering) Task (computing) Debugging Electronic engineering business Automatic testing Quality assurance Simulation media_common
Zdroj:	Proceedings ETC 93 Third European Test Conference.
DOI:	10.1109/etc.1993.246611
Popis:	The comparison of measured versus expected signals is the basic operation of any test process. It becomes a critical task especially when rather noisy contactless measurement techniques are employed for prototype debug and quality assurance purposes. The presentation describes ways of get most reasonable pass/fail decisions in the case of uncertainties. >
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::58143fe76f36501fd1dc48aa0a4312f9 https://doi.org/10.1109/etc.1993.246611 Zobrazit plný text záznamu