MoO3 films grown on stepped sapphire (0001) by molecular beam epitaxy
| Autor: | Petr Novotný, H. Henry Lamb |
|---|---|
| Rok vydání: | 2021 |
| Předmět: |
Materials science
business.industry Annealing (metallurgy) Bilayer Surfaces and Interfaces Condensed Matter Physics Surfaces Coatings and Films Monocrystalline silicon X-ray photoelectron spectroscopy Transmission electron microscopy Sapphire Optoelectronics Thin film business Molecular beam epitaxy |
| Zdroj: | Journal of Vacuum Science & Technology A. 39:043406 |
| ISSN: | 1520-8559 0734-2101 |
| DOI: | 10.1116/6.0000962 |
| Popis: | MoO3 films were grown on stepped c-plane sapphire substrates by molecular beam epitaxy using MoO3 vapor from a conventional Knudsen cell. Stepped sapphire (0001) substrates were prepared by ex situ annealing at 1100–1300 °C in dry air. Step bunching typically resulted in multistepped surfaces with wide atomically smooth terraces. Ex situ annealing at 1100 °C followed by in vacuo annealing at 700 °C provided clean substrates for growth. Ultrathin films were grown at 450 °C via a self-limiting process that represents a balance between the incident MoO3 flux and the desorption flux. Elongated bilayer islands (0.7-nm thick) were formed on sapphire (0001) terraces. Monocrystalline α-MoO3 (010) thin films [(010)α-MoO3∥(0001)sapphire] were grown at 450 °C using a higher incident MoO3 flux and characterized by atomic force microscopy, x-ray photoelectron spectroscopy, x-ray diffraction, and cross-sectional transmission electron microscopy. The step-terrace surface morphology of the monocrystalline films strongly suggests multilayer growth. |
| Databáze: | OpenAIRE |
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